Research on Postharvest Sugar Degradation Mechanism and Cold Chain Preservation Technology Innovation in Sweet Corn

Abstract

Postharvest sugar degradation, quality deterioration, and short shelf life are common problems in sweet corn, severely restricting industry development. Existing research has limitations such as single-dimensional mechanism analysis and insufficient targeted preservation technology. This study focuses on the postharvest sugar degradation mechanism of sweet corn and targeted cold chain preservation technology. It analyzes the degradation mechanism from multiple dimensions, including varietal differences, molecular-physiological synergy, and environmental interaction. A targeted design of a precise pre-cooling, compound preservative, dynamic modified atmosphere, and intelligent monitoring integrated cold chain technology was developed. The application effect was evaluated through compatibility verification and empirical analysis. Results show that there are significant differences in sugar degradation characteristics among different types of sweet corn. Sucrase and amylase are the core regulatory enzymes, and genes such as SPS and SS participate in metabolic regulation. The compound preservation technology can reduce sucrase and amylase activities by 65% and 61%, respectively, achieving a sugar retention rate of 78%-82% after 15 days and extending the shelf life to 15 days, with an input-output ratio of 1:3.2. This study constructed a variety-specific preservation scheme, clarified the compatibility of technology and mechanism, and provided theoretical support and practical technology for postharvest preservation of sweet corn, helping to improve the quality and efficiency of the industry.